Blank Cover Image

Fringe-line detection of interferometric phase images

Author(s):
Publication title:
Image Matching and Analysis
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4552
Pub. date:
2001
Vol.:
4552
Page(from):
190
Page(to):
195
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442802 [0819442801]
Language:
English
Call no.:
P63600/4552
Type:
Conference Proceedings

Similar Items:

Zhou,Z., Chen,Z., Prinet,V., Ma,S.

SPIE-The International Society for Optical Engineering

Cheng J, Chung R, Lam E Y, Fung K S M, Wang F, Leung W H

SPIE - The International Society of Optical Engineering

Zhang,Y., Wu,Y., Wang,L., Peng,H.

SPIE - The International Society for Optical Engineering

K. Qian, B. Pan, F. Lin, H. S. Seah, A. Asundi

Society of Photo-optical Instrumentation Engineers

Ma, L., Wang, R., Han, Y., He, S.

SPIE-The International Society for Optical Engineering

Cao, J. N., Zhang, Y. B., Wang, W. X., Hai, T.

SPIE - The International Society of Optical Engineering

Wernicke, G.K., Kallmeyer, F., Krueger, S., Gruber, H., Kayser, D.

SPIE-The International Society for Optical Engineering

10 Conference Proceedings Fringe tracker for the VLTI spectro-imager

L. Corcione, D. Bonino, D. F. Busher, M. Gai, S. Ligori

Society of Photo-optical Instrumentation Engineers

Lee,H., Wang,L.-S., Krishnaswamy,S.

SPIE-The International Society for Optical Engineering

D. F. Buscher, J. S. Young, F. Baron, C. A. Haniff

Society of Photo-optical Instrumentation Engineers

Arsenault, R., Kervella, P., Donaldson, R., Kasper, M. E., Fedrigo, E., Wallander, A., Scholler, M., Housen, N., …

SPIE - The International Society of Optical Engineering

Kruger,S., Wernicke,G.K., Osten,W., Kayser,D., Demoli,N., Gruber,H.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12