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Investigation on internal microstructure damage evolution in Bi-2223/Ag HTS tapes by synchrotron radiation

Author(s):
Hu,X.F. ( Univ. of Science and Technology of China )
Yang,J.L.
Jiang,Z.Y.
Wu,X.P.
Wang,Z.
Tian,Y.L.
Huang,W.X.
2 more
Publication title:
Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4537
Pub. Year:
2001
Page(from):
237
Page(to):
240
Pages:
4
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442611 [0819442615]
Language:
English
Call no.:
P63600/4537
Type:
Conference Proceedings

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