Absolute EUV yield of laser-irradiated Xe-clusters dependent on pulse width
- Author(s):
Nickles,P.V. ( Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy ) Schnurer,M. Stiel,H. Vogt,U. Ter-Avetisyan,S.A. Sandner,W. - Publication title:
- Applications of X rays generated from lasers and other bright sources II : 30-31 July 2001, San Diego, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4504
- Pub. Year:
- 2001
- Page(from):
- 106
- Page(to):
- 113
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442185 [0819442186]
- Language:
- English
- Call no.:
- P63600/4504
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
EUV-emission of xenon clusters excited by a high-repetition-rate burst-mode laser
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Sulfur capillary discharge irradiated by a picosecond-laser pulse:a new way toward collisionally pumped tabletop x-ray lasers
SPIE - The International Society for Optical Engineering |
2
Conference Proceedings
Scaling-up a liquid water jet laser plasma source to high average power for extreme-ultraviolet lithography
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
New laboratory EUV reflectometer for large optics using a laser plasma source
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
4
Conference Proceedings
Characterization of a laser-produced plasma source for a laboratory EUV reflectometer
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
11
Conference Proceedings
Modeling of tabletop transient inversion and capillary x-ray lasers (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |