Digital projection systems based on LCOS
- Author(s):
- Millikan,B.D. ( Three-Five Systems )
- Wellman,J.S.
- Publication title:
- Solar and switching materials : 1-2 April 2001, Orlando, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4458
- Pub. Year:
- 2001
- Page(from):
- 226
- Page(to):
- 229
- Pages:
- 4
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819441720 [0819441724]
- Language:
- English
- Call no.:
- P63600/4458
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Two-panel LCOS-based projection system: a potentially compact high-resolution avionics display
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Design of polarization interference filter used for LCOS projection display
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Assessment of lesion detectability of Monte Carlo modeling of digital radiography systems
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Automatic model-based 3D lesion segmentation for evaluation of MR-guided thermal ablation therapy
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Characterization of tissue response to radiofrequency ablation using 3D model-based analysis of interventional MR images
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
A taxonomy of optical architectures for LCOS projection displays (Invited Paper)
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
Development and calibration of an automated Mueller matrix polarization system for skin lesion differentiation
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Dimensional metrology of resist lines using a SEM model-based library approach
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |