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Recent developments in spectroscopic ellipsometry for in-situ applications

Author(s):
Johs,B.D. ( J.A. Woollam Co., Inc. )
Hale,J.
Ianno,N.J.
Herzinger,C.M.
Tiwald,T.E.
Woollam,J.A.
1 more
Publication title:
Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August 2001 San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4449
Pub. Year:
2001
Page(from):
41
Page(to):
57
Pages:
17
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441638 [0819441635]
Language:
English
Call no.:
P63600/4449
Type:
Conference Proceedings

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