Blank Cover Image

Line x-ray emission from Al targets irradiatied by high-intensity variable-length laser pulses

Author(s):
Limpouch,J. ( Czech Technical Univ. )
Renner,O.
Krousky,E.
Uschmann,I.
Forster,E.
Kalachnikov,M.P.
Nickles,P.V.
2 more
Publication title:
ECLIM 2000 : 26th European Conference on Laser Interaction with Matter, 12-16 June, 2000, Prague, Czech Republic
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4424
Pub. Year:
2000
Page(from):
549
Page(to):
552
Pages:
4
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441317 [0819441317]
Language:
English
Call no.:
P63600/4424
Type:
Conference Proceedings

Similar Items:

Limpouch, J., Renner, O., Krousky, E., Kralikova, B., Skala, J., Forster, E., Lybcke, A., Uschmann, I., Iskakov, A.B., …

SPIE - The International Society of Optical Engineering

Teubner,U., Uschmann,I., Theobald,W., Forster,E.

SPIE-The International Society for Optical Engineering

Andreev,A.A., Limpouch,J., Nakano,H.

SPIE - The International Society for Optical Engineering

Renner,O., Peyrusse,O., Sondhauss,P., Krousky,E., Forster,E.

SPIE-The International Society for Optical Engineering

Janulewicz,K.A., Bortolotto,F., Warwick,P.J., Kalachnikov,M.P., Shlyaptsev,V.N., Sandner,W., Rocca,J.J., Nickles,P.V.

SPIE - The International Society for Optical Engineering

Shlyaptsev,V.N., Rocca,J.J., Kalachnikov,M.P., Nickles,P.V., Sandner,W., Osterheld,A.L., Dunn,J., Eder,D.C.

SPIE-The International Society for Optical Engineering

Andreev, A. A., Nakano, H., Limpouch, J.

SPIE - The International Society of Optical Engineering

Andreev,A.A., Limpouch,J.

SPIE-The International Society for Optical Engineering

P.V. Nickles, M. Schnürer, M.P. Kalachnikov, I. Will, W. Sandner

Society of Photo-optical Instrumentation Engineers

11 Conference Proceedings X-ray laser enhancement with multipulsing

Tallents,G.J., Lin,J.Y., Demir,A., Behjat,A., Smith,R., Zhang,J., Wolfrum,E., Wark,J.S., Key,M.H., Lewis,C.L.S., …

SPIE-The International Society for Optical Engineering

Renner, O., Forster, E., Uschmann, I., Eidmann, K.

SPIE - The International Society of Optical Engineering

Nickles,P.V., Schnurer,M., Kalachnikov,M.P., Sandner,W., Shlyaptsev,V.N., Danson,C.N., Neely,D., Wolfrum,E., Zhang,J., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12