Blank Cover Image

Unique criterion to estimate the performances of some laser diode range finders

Author(s):
Publication title:
Laser metrology for precision measurement and inspection in industry : 13-15 October 1999, Florianópolis, Brazil
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4420
Pub. Year:
1999
Page(from):
32
Page(to):
41
Pages:
10
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441270 [0819441279]
Language:
English
Call no.:
P63600/4420
Type:
Conference Proceedings

Similar Items:

Bazin,G., Journet,B.

SPIE-The International Society for Optical Engineering

Servagent,N., Mourat,C., Gouaux,F., Bosch,T.M.

SPIE-The International Society for Optical Engineering

Journet,B., Bazin,G.

SPIE-The International Society for Optical Engineering

White, M. L., Shaklan, S. B., Lisman, P. D., Ho, T., Mouroulis, P., Basinger, S. A., Ledeboer, W., Kwack, E., Kissil, …

SPIE - The International Society of Optical Engineering

Poujouly,S., Journet,B.

SPIE-The International Society for Optical Engineering

Zhang, Q., Pless, R. B.

SPIE - The International Society of Optical Engineering

Journet, B. A.

SPIE-The International Society for Optical Engineering

Journet,B., Poujouly,S.

SPIE - The International Society for Optical Engineering

C.-U. Kang, H. Wang, T. Ishimatsu, T. Ochiai

Society of Photo-optical Instrumentation Engineers

Bartolini, L., Collibus, M. Ferri de, Fornetti, G., Guarneri, M., Paglia, E., Poggi, C., Ricci, R.

SPIE - The International Society of Optical Engineering

Stefani,M.A., Pizolato,J.C.,Jr., Neto,L.G.

SPIE - The International Society for Optical Engineering

Xiao, L.-T., Alleaume, R., Xuan, Q.D., Treussart, F., Journet, B.A., Roch, J.-F.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12