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Photoreflectance investigation of δ-doped MOVPE-grown AlxGa1-xAs layers

Author(s):
Nowaczyk-Utko,M. ( Wroclaw Univ. of Technology )
Sek,G.
Misiewicz,J.
Sciana,B.
Radziewicz,D.
Tlaczala,M.J.
1 more
Publication title:
International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4413
Pub. date:
2000
Vol.:
4413
Page(from):
254
Page(to):
257
Pages:
4
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441164 [0819441163]
Language:
English
Call no.:
P63600/4413
Type:
Conference Proceedings

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