Self-testable CMOS thermopile-based infrared imager
- Author(s):
- Charlot,B. ( TIMA Lab. )
- Parrain,F.
- Mir,S.
- Courtois,B.
- Publication title:
- Design, test, integration, and packaging of MEMS/MOEMS 2001 : 25-27 April 2001, Cannes, France
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4408
- Pub. Year:
- 2001
- Page(from):
- 96
- Page(to):
- 103
- Pages:
- 8
- Pub. info.:
- Bellingham, Washington: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819441096 [0819441090]
- Language:
- English
- Call no.:
- P63600/4408
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
9
Conference Proceedings
Highly Sensitive Infrared Temperature Sensor for CMOS Compatible Thermopiles
Trans Tech Publications |
4
Conference Proceedings
Design of an APS CMOS image sensor for space applications using standard CAD tools and CMOS technology
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |