Integrated metrology: an enabler for advanced process control (APC)
- Author(s):
- Schneider,C. ( Fraunhofer Institute for Integrated Circuits )
- Pfitzner,L.
- Ryssel,H.
- Publication title:
- In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4406
- Pub. Year:
- 2001
- Page(from):
- 118
- Page(to):
- 130
- Pages:
- 13
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819441072 [0819441074]
- Language:
- English
- Call no.:
- P63600/4406
- Type:
- Conference Proceedings
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