Blank Cover Image

Application of digital holographic microscopy for inspection of micro-optical components

Author(s):
Publication title:
Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4398
Pub. Year:
2001
Page(from):
189
Page(to):
198
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440938 [0819440930]
Language:
English
Call no.:
P63600/4398
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Characterization of micro-optics using digital holography

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings Principles of digital holographic interferometry

Kreis,T.M., Juptner,W.P.O., Geldmacher,J.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings New approach for testing of aspherical micro-optics with high numerical aperture

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Application of digital speckle photography for local strain analysis

Holstein,D., Theiler,C., Hartmann,H.-J., Juptner,W.P.

SPIE - The International Society for Optical Engineering
3 Conference Proceedings Investigation of laser welds by means of digital speckle photography

Holstein,D., Hartmann,H.-J., Juptner,W.P.O.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Combined 3D-shape and deformation analysis of small objects using coherent optical techniques on the basis of digital holography

Seebacher,S., Baumbach,T., Osten,W., Juptner,W.P.O.

SPIE - The International Society for Optical Engineering
4 Conference Proceedings Detection and compensation of misalignment for interferometric diagnostic tools applied in space-borne facilities

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O., Schnars,U., Gatti,L., Becker,J.

SPIE - The International Society for Optical Engineering
10 Conference Proceedings Characterisation of high-density particle distributions for optimisation of laser cladding processes using digital holography [5856-71]

Kebbel, V., Geldmacher, J., Partes, K., Juptner, W.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Characterization of aspherical micro-optics using digital holography: improvement of accuracy

Kebbel, V., Mueller, J., Jueptner, W.P.O.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Digital holographic microscopy for nanometric quality control of micro-optical components

J. Kuhn, F. Charriere, T. Colomb, E. Cuche, Y. Emery, C. Depeursinge

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Application of digital holography for the inspection of microcomponents

Osten,W., Seebacher,S., Juptner,W.P.O.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Particle analysis with digital holography

Adams,M., Kreis,T.M., Juptner,W.P.O.

SPIE - The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12