Blank Cover Image

Wavelet processing for image denoising and edge detection in automatic corrosion detection algorithms used in shipboard ballast tank video inspection systems

Author(s):
Nelson,B.N. ( Geo-Centers, Inc. )
Slebodnick,P.
Lemieux,E.J.
Singleton,W.
Krupa,M.
Lucas,K.
Thomas,E.D.
Seelinger,A.
3 more
Publication title:
Wavelet applications VIII : 18-20 April 2001, Orlando, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4391
Pub. Year:
2001
Page(from):
134
Page(to):
145
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440860 [0819440868]
Language:
English
Call no.:
P63600/4391
Type:
Conference Proceedings

Similar Items:

Nelson, B.N., Slebodnick, P., Lemieux, E.J., Krupa, M., Preisser, R., Lucas, K.

SPIE-The International Society for Optical Engineering

Li, H.G., Wang, J.

SPIE-The International Society for Optical Engineering

Nelson, B.N., Slebodnick, P., Lemieux, E.J.

SPIE-The International Society for Optical Engineering

Nelson,D.J., Cristobal,G., Kober,V., Cakrak,F., Loughlin,P.J., Cohen,L.

SPIE - The International Society for Optical Engineering

Nelson, B.N., Slebodnick, P., Groeninger, W., Lemieux, E.J.

SPIE - The International Society of Optical Engineering

Raghuveer,M.R.

SPIE-The International Society for Optical Engineering

Nelson, B. N., Slebodnick, P., Groeninger, W., Lemieux, E. J.

SPIE - The International Society of Optical Engineering

X. Zhou, E. Dorrer

Society of Photo-optical Instrumentation Engineers

Wei, Y., Shi, Z., Yu, H.

SPIE-The International Society for Optical Engineering

J. Shi, T. Chen, W. Cai

Society of Photo-optical Instrumentation Engineers

Pousse, A., Dornier, C., Parmentier, M., Kastler, B., Chavanelle, J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12