Blank Cover Image

Mining association rules between low-level image features and high-level concepts

Author(s):
Publication title:
Data mining and knowledge discovery : theory, tools, and technology III : 16-17 April 2001, Orlando, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4384
Pub. Year:
2001
Page(from):
279
Page(to):
290
Pages:
12
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440792 [0819440795]
Language:
English
Call no.:
P63600/4384
Type:
Conference Proceedings

Similar Items:

Stan,D., Sethi,I.K.

SPIE-The International Society for Optical Engineering

Mustafa, A., Sethi, I.K.

SPIE - The International Society of Optical Engineering

I.K. Sethi, K. Han

Society of Photo-optical Instrumentation Engineers

Li,D., Wei,G., Sethi,I.K., Dimitrova,N.

SPIE-The International Society for Optical Engineering

Z. Wang, L. Xue, D. Feng

Society of Photo-optical Instrumentation Engineers

Li,X., Sethi,I.K.

SPIE - The International Society for Optical Engineering

Sethi,I.K.

SPIE - The International Society for Optical Engineering

Shen,B., Sethi,I.K.

SPIE-The International Society for Optical Engineering

Qin K., Guan Z., Li D., Wang X., Xiao Q.

SPIE - The International Society of Optical Engineering

N. Ramesh, I.K. Sethi

Society of Photo-optical Instrumentation Engineers

Sethi,I.K., Coman,I., Day,B., Jiang,F., Li,D., Segovia-Juarez,J., Wei,G., You,B.

SPIE-The International Society for Optical Engineering

Guan, Z.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12