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High-sensitivity (25-μm pitch) microbolometer FPAs and application development

Author(s):
Murphy,D.F. ( Raytheon Infrared Operations )
Ray,M.
Wyles,R.
Asbrock,J.F.
Lum,N.A.
Kennedy,A.
Wyles,J.
Hewitt,C.
Graham,G.E.
Radford,W.A.
Anderson,J.S.
Bradley,D.
Chin,R.
Kostrzewa,T.
9 more
Publication title:
Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4369
Pub. Year:
2001
Page(from):
222
Page(to):
234
Pages:
13
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440648 [0819440647]
Language:
English
Call no.:
P63600/4369
Type:
Conference Proceedings

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