Characterization of the WISP array performance in ambient and cryogenic operating environments

Characterization of the WISP array performance in ambient and cryogenic operating environments

Author(s):

Kircher,J.R. ( AEgis Technologies Group, Inc. )
Olson,E.M.
Bergin,T.P.
Flynn,D.S.

Publication title:

Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4366

Pub. Year:

2001

Page(from):

158

Page(to):

167

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819440617 [0819440612]

Language:

English

Call no.:

P63600/4366

Type:

Conference Proceedings

Details

TDL ID:	ZA00012082
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Technologies for synthetic environments : hardware-in-the-loop testing
Conf. info. (Number):	2001 : 6th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2001.04.16-2001.04.18

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