Investigation on the mechanism of the 193-nm resist linewidth reduction during the SEM measurement
- Author(s):
- Wu,C.-H.J. ( IBM Semiconductor Research and Development Ctr. )
- Huang,W.-S.
- Chen,K.-J.R.
- Archie,C.N.
- Lagus,M.E.
- Publication title:
- Advances in Resist Technology and Processing XVIII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4345
- Pub. Year:
- 2001
- Vol.:
- 4345
- Pt.:
- One of Two Parts
- Page(from):
- 190
- Page(to):
- 199
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819440310 [0819440310]
- Language:
- English
- Call no.:
- P63600/4345
- Type:
- Conference Proceedings
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