Lens-heating-induced focus drift of l-line step and scan: correction and control in a manufacturing environment
- Author(s):
Ho,G.H. ( ASML ) Cheng,A.T. Chen,C.-J. Fang,C.-K. Li,M.-C. Chang,I-C. Chu,P.-T. Chu,Y.C. Shu,K.-Y. Huang,C.-Y. Yeh,H.-L. Shiao,H.C. Lan,H.K. - Publication title:
- Metrology, Inspection, and Process Control for Microlithography XV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4344
- Pub. Year:
- 2001
- Page(from):
- 289
- Page(to):
- 296
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819440303 [0819440302]
- Language:
- English
- Call no.:
- P63600/4344
- Type:
- Conference Proceedings
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