Nonlinear optical characterization of single-crystalline GaN by Z-scan technique

Nonlinear optical characterization of single-crystalline GaN by Z-scan technique

Author(s):

Pacebutas,V. ( Semiconductor Physics Institute )

Publication title:

Smart optical inorganic structures and devices : 16-19 August 2000, Vilnius, Lithuania

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4318

Pub. Year:

2000

Page(from):

135

Page(to):

139

Pages:

5

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819440006 [0819440000]

Language:

English

Call no.:

P63600/4318

Type:

Conference Proceedings

Details

TDL ID:	ZA00012034
Series ID:	PA00000029
Conf. info. (Name):	Smart Optical Inorganic Structures and Devices
Conf. info. (Number):	2000
Conf. info. (Venue):	Vilnius, Lithuania
Conf. info. (Date):	2000.08.16-2000.08.19

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