Characterization of the fulgide-doped PMMA films and investigation of photochromic reaction of Langmuir-Blodgett films as recording materials
- Author(s):
Lafond,C. ( COPL/Univ. Laval ) Pouraghajani,O. Tork,A. Bolte,M. Ritcey,A.M. Lessard,R.A. - Publication title:
- Practical holography XV and Holographic materials VII : 22-23 January 2001, San Jose, [California] USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4296
- Pub. Year:
- 2001
- Page(from):
- 226
- Page(to):
- 236
- Pages:
- 11
- Pub. info.:
- Bellingham, Washington: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819439741 [0819439746]
- Language:
- English
- Call no.:
- P63600/4296
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
Fulgide-based WRE holographic materials: influence of the matrix on the fatigue process
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
High-density rewritable holographic recording onto photochromic composite media
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Primary photochemical process in chromium-doped polymeric material: interactivity with holography
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Spectral and holographic characterization of new photochromic compounds based on substituted spiropyrans
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Metal-doped photosensitive materials:correlation between photoreactivity and holography
SPIE - The International Society for Optical Engineering |