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Reliability of polysilicon thin film transistors on stainless steel foil substrates

Author(s):
Publication title:
Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, [California] USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4295
Pub. Year:
2001
Page(from):
108
Page(to):
112
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439734 [0819439738]
Language:
English
Call no.:
P63600/4295
Type:
Conference Proceedings

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