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Metal-semiconductor-metal photodetectors

Author(s):
Berger,P.R. ( The Ohio State Univ. )  
Publication title:
Testing, Reliability, and Applications of Optoelectronic Devices
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4285
Pub. Year:
2001
Page(from):
198
Page(to):
207
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439635 [0819439630]
Language:
English
Call no.:
P63600/4285
Type:
Conference Proceedings

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