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Temperature dependence of threshold current: a better criterion than Tο?

Author(s):
Houle,T.J. ( Univ. of Bristol )
Onischenko,A.I.
Rorison,J.M.
Penty,R.V.
White,I.H.
Springthorpe,A.J.
White,K.
Paddon,P.
Garanzotis,T.
4 more
Publication title:
Physics and Simulation of Optoelectronic Devices IX
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4283
Pub. Year:
2001
Page(from):
238
Page(to):
246
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439611 [0819439614]
Language:
English
Call no.:
P63600/4283
Type:
Conference Proceedings

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