Das, B.K., Becker, C., Oesselke, T., Ricken, R., Quiring, V., Suche, H., Sohler, W.
SPIE-The International Society for Optical Engineering
|
McCoy, M. A., Dregia, S. A., Lee, W. E., Sanford, N. A.
Materials Research Society
|
Sohler,W., Suche,H.
SPIE-The International Society for Optical Engineering
|
Suche,H.
SPIE - The International Society for Optical Engineering
|
Buchal, Ch., Brinkmann, R., Sohler, W., Suche, H.
Materials Research Society
|
Yoon, H.-D., Yang, W.-S., Lee, H.-Y., Yoon, D.-W.
SPIE-The International Society for Optical Engineering
|
Noe,R., Maucher,A., Ricken,R.
SPIE - The International Society for Optical Engineering
|
Lin, H.-Y., Ning, J.-P., Geng, F.
SPIE - The International Society of Optical Engineering
|
Lee, Y. L., Noh, Y.-C., Jung, C., Yu, T. J., Yu, B.-A., Ko, D.-K., Lee, J.
SPIE - The International Society of Optical Engineering
|
Ramponi,R., Russo,V., Marangoni,M., Osellame,R., Banfi,G.P., Degiorgio,V., Cristiani,I., Tartara,L.
SPIE - The International Society for Optical Engineering
|
Sohler,W.
SPIE - The International Society for Optical Engineering
|
Fleuster, M., Buchal, Ch., Holzbrecher, H., Breuer, U., Dinand, M., Suche, H., Brinkmann, R., Sohler, W.
Materials Research Society
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