Measurement of the fluorescence of restorative dental materials using a 655-nm diode laser

Measurement of the fluorescence of restorative dental materials using a 655-nm diode laser

Author(s):

Zanin,F.A. ( Univ. Federal do Rio de Janeiro )

Publication title:

Lasers in dentistry VII : 21-22 January 2001, San Jose, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4249

Pub. Year:

2001

Page(from):

145

Page(to):

151

Pages:

7

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819439277 [0819439274]

Language:

English

Call no.:

P63600/4249

Type:

Conference Proceedings

Details

TDL ID:	ZA00011965
Series ID:	PA00000029
Conf. info. (Name):	SPIE BiOS : Lasers in dentistry
Conf. info. (Number):	2001 : 7th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2001.01.21-2001.01.22

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