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Determination of simulated burn depth using relative fluctuation of backscattering light

Author(s):
Publication title:
Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4224
Pub. Year:
2000
Page(from):
206
Page(to):
209
Pages:
4
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438959 [0819438952]
Language:
English
Call no.:
P63600/4224
Type:
Conference Proceedings

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