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Interferogram processing with wavelet analysis and spectrogram reconstruction

Author(s):
Publication title:
Process Control and Inspection for Industry
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4222
Pub. Year:
2000
Page(from):
91
Page(to):
94
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437945 [0819437948]
Language:
English
Call no.:
P63600/4222
Type:
Conference Proceedings

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