Blank Cover Image

Surface 3D topography measurement of roller

Author(s):
Publication title:
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4221
Pub. Year:
2000
Page(from):
125
Page(to):
128
Pages:
4
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438928 [0819438928]
Language:
English
Call no.:
P63600/4221
Type:
Conference Proceedings

Similar Items:

Jiang,J., He,Y., Yan,Y., Zhao,W., Xu,Y.

SPIE-The International Society for Optical Engineering

J. Du, X. Liang, Y. Xu, R. Li, C. Yan, G. Zhao, L. Su, J. Xu, Z. Xu

SPIE - The International Society of Optical Engineering

Jiang,J., He,Y., Zhao,W.

SPIE - The International Society for Optical Engineering

G.J. Jiang, Q. Tao, W.D. Liu, J.Y. Xu, H.Y. Zhao

Trans Tech Publications

Jiang,J., He,Y., Zhao,W.

SPIE - The International Society for Optical Engineering

S. Liu, J. Zhao, W.Z. Qin, J.M. Pang

Trans Tech Publications

H. Jiang, G. He

Society of Photo-optical Instrumentation Engineers

W.Z. Qin, J. Zhao, W.M. Huang, D.W. Wang

Trans Tech Publications

G.B. Pang, D. Chen, F. Teng, Z.F. Wei, W.J. Xu

Trans Tech Publications

Xu, J., Durisin, D.P., Zhao, Q., Auner, G.W.

SPIE-The International Society for Optical Engineering

C. Tang, G. He, C. Xu, L. Zhao, J. Hu

Society of Photo-optical Instrumentation Engineers

Qi, G.S., Tan, W., Mai, X.S., Xu, D.Y., Jiang, P.J., Ye, D.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12