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Single-scan method for determination of the thickness and optical constant of thin metal film

Author(s):
Zhang,A.
Yuan,B.
Cao,Z.
Shen,Q.
Dou,X.
Chen,Y.
Tashiro,H.
2 more
Publication title:
Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4220
Pub. Year:
2000
Page(from):
130
Page(to):
134
Pages:
5
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438911 [081943891X]
Language:
English
Call no.:
P63600/4220
Type:
Conference Proceedings

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