Trends in Lifetime Measurements

Trends in Lifetime Measurements

Author(s):: Schroder,D.K.
Publication title:: High Purity Silicon VI : proceedings of the sixth International Symposium
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 4218
Pub. Year:: 2000
Page(from):: 365
Page(to):: 382
Pages:: 18
Pub. info.:: Pennington, N.J. — Bellingham, Wash.: Electrochemical Society — SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9781566772846 [1566772842]
Language:: English
Call no.:: P63600/4218
Type:: Conference Proceedings

Details

TDL ID:	ZA00011937
Series ID:	PA00000029
Conf. info. (Name):	Internationa Symposium on High Purity Silicon [ SPIE 0819438901 ] : Meeting of the Electrochemical Society
Conf. info. (Number):	6th : 198th
Conf. info. (Venue):	Phoenix, AZ, USA
Conf. info. (Date):	2000.10.22-2000.10.27

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