Method to measure the MTF of imaging spectrograph with multiline scanning

Method to measure the MTF of imaging spectrograph with multiline scanning

Author(s):: Huang,X.
Publication title:: Advanced environmental and chemical sensing technology : 5-8 November 2000, Boston, USA
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 4205
Pub. Year:: 2000
Page(from):: 43
Page(to):: 52
Pages:: 10
Pub. info.:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819438706 [0819438707]
Language:: English
Call no.:: P63600/4205
Type:: Conference Proceedings

Details

TDL ID:	ZA00011924
Series ID:	PA00000029
Conf. info. (Name):	Photonics East : Advanced environmental and chemical sensing technology
Conf. info. (Number):	2000
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2000.11.05-2000.11.08

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