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Contactless measurements of charge traps and carrier lifetimes in detector-grade cadmium zinc telluride and mercuric iodide

Author(s):
Publication title:
Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4141
Pub. Year:
2000
Page(from):
76
Page(to):
88
Pages:
13
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437860 [0819437867]
Language:
English
Call no.:
P63600/4141
Type:
Conference Proceedings

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