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X-ray measurements with compound semiconductor arrays

Author(s):
Owens,A.
Andersson,H.
Bavdaz,M.
Brammertz,G.
Gagliardi,T.
Gostilo,V.
Lisjutin,I.
Loupilov,A.
Major,I.
Mastrikov,Y.
Nenonen,S.A.
Peacock,A.J.
Poelaert,A.
Sipila,H.
Troger,L.
10 more
Publication title:
Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4141
Pub. Year:
2000
Page(from):
55
Page(to):
66
Pages:
12
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437860 [0819437867]
Language:
English
Call no.:
P63600/4141
Type:
Conference Proceedings

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