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High-resolution imaging microchannel plate detector for EUV spectrometry

Author(s):
Bannister,N.P.
Lapington,J.S.
Barstow,M.A.
Fraser,G.W.
Sanderson,B.S.
Tandy,J.A.
Pearson,J.F.
Spragg,J.E.
3 more
Publication title:
X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4140
Pub. date:
2000
Vol.:
4140
Page(from):
199
Page(to):
210
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437853 [0819437859]
Language:
English
Call no.:
P63600/4140
Type:
Conference Proceedings

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