Measurements with the Chandra X-Ray Observatory's flight contamination monitor
- Author(s):
Elsner,R.F. Kolodziejczak,J.J. O'Dell,S.L. Swartz,D.A. Tennant,A.F. Weisskopf,M.C. - Publication title:
- X-ray optics, instruments, and missions IV : 30-31 July 2000, San Diego, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4138
- Pub. Year:
- 2000
- Page(from):
- 1
- Page(to):
- 9
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819437839 [0819437832]
- Language:
- English
- Call no.:
- P63600/4138
- Type:
- Conference Proceedings
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