Radiation-induced dark signal in 0.5-μm CMOS APS image-sensors

Radiation-induced dark signal in 0.5-μm CMOS APS image-sensors

Author(s):

Eid,E.-S.I.

Publication title:

Photonics for space environments VII : 31 July - 1 August 2000, San Diego, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4134

Pub. Year:

2000

Page(from):

115

Page(to):

123

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437792 [0819437794]

Language:

English

Call no.:

P63600/4134

Type:

Conference Proceedings

Details

TDL ID:	ZA00011859
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Photonics for Space Environments
Conf. info. (Number):	2000 : 7th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2000.07.31-2000.08.01

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