Performance of 320×240 uncooled IRFPA with SOI diode detectors
- Author(s):
Ishikawa,T. Ueno,M. Nakaki,Y. Endo,K. Ohta,Y. Nakanishi,J. Kosasayama,Y. Yagi,H. Sone,T. Kimata,M. - Publication title:
- Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4130
- Pub. Year:
- 2000
- Page(from):
- 152
- Page(to):
- 159
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819437754 [0819437751]
- Language:
- English
- Call no.:
- P63600/4130
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
Spectral responsivity measurement of uncooled IRFPA using a free-electron laser
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
High-performance and low-thermal time constant amorphous silicon-based 320×240 uncooled microbolometer IRFPA
SPIE - The International Society of Optical Engineering |