Blank Cover Image

Image denoising using a local Gaussian scale mixture model in the wavelet domain

Author(s):
Publication title:
Wavelet applications in signal and image processing VIII : 31 July-4 August, 2000, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4119
Pub. Year:
2000
Vol.:
4119
Pt.:
One of Two Parts
Page(from):
363
Page(to):
371
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437648 [0819437646]
Language:
English
Call no.:
P63600/4119
Type:
Conference Proceedings

Similar Items:

Simoncelli,E.P.

SPIE - The International Society for Optical Engineering

Yuan, H., Zhang, X.-P., Guan, L.

SPIE-The International Society for Optical Engineering

Portilla, J.

SPIE - The International Society of Optical Engineering

H. Rabbani, M. Vafadust

SPIE - The International Society of Optical Engineering

Wang, Z., Simoncelli, E. P.

SPIE - The International Society of Optical Engineering

Wang, Z., Simoncelli, E.P.

SPIE - The International Society of Optical Engineering

Wainwright,M.J., Simoncelli,E.P., Willsky,A.S.

SPIE-The International Society for Optical Engineering

H. Rabbani, M. Vafadust, I. Selesnick

Society of Photo-optical Instrumentation Engineers

J. Portilla, J. A. Guerrero-Colon

Society of Photo-optical Instrumentation Engineers

Eom, I. K., Kim, Y. S.

SPIE - The International Society of Optical Engineering

Yuan J., Hu Z.

SPIE - The International Society of Optical Engineering

Dolan,P.D., Agaian,S.S., Noonan,J.P.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12