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Photoluminescence characterization in GaAs/AlGaAs quantum well infrared photodetectors

Author(s):
Cai,W.Y.
Li,Z.-F.
Li,N.
Lu,W.
Zhou,J.M.
Huang,Q.
1 more
Publication title:
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4086
Pub. Year:
2000
Page(from):
294
Page(to):
297
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437297 [0819437298]
Language:
English
Call no.:
P63600/4086
Type:
Conference Proceedings

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