Blank Cover Image

Study of Thin Organic Films by Various Scanning Force Microscopes

Author(s):
Fujihira M.  
Publication title:
Forces in scanning probe methods
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
286
Pub. Year:
1995
Page(from):
567
Page(to):
591
Pages:
25
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792334064 [079233406X]
Language:
English
Call no.:
N11482/286
Type:
Conference Proceedings

Similar Items:

Fujihira M.

Kluwer Academic Publishers

Fan, X.J., Murakami, M., Takahasi, R., Koida, T., Matsumoto, Y., Hasegawa, T., Fukumura, T., Kawasaki, M., Ahmet, P., …

Materials Research Society

Kuwabara, M., Smith, D.A., Welland, M.E.

Materials Research Society

Bar, G., Rubin, S., Parikh, A. N., Swanson, B. I., Zawodzinski, T. A.

MRS - Materials Research Society

Mou,X., You,Y., Zhuo,Y., Yang,Y., Xu,M.

SPIE-The International Society for Optical Engineering

4 Conference Proceedings A Scanning Force and Friction Microscope

Niedermann Ph., Burger J., Binggeli M., Christoph R., Hintermann E. H., Marti O.

Kluwer Academic Publishers

Ruetschi M., Guntherodt -J. H., Grutter P., Funfschilling J.

Kluwer Academic Publishers

Fujihira, M., Tani, Y., Furugori, M., Okabe, Y., Akiba, U., Yagi, K., Okamoto, S.

Elsevier

S.P. Sapers

Society of Photo-optical Instrumentation Engineers

R.I. Hegde, M.A. Chanko, P.J. Tobin

Electrochemical Society

Zheng, Xiang-Yang, Lowndes, D. H.,, Zhu, Shen, Warmack, R. J.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12