Tsen T. K., Chia C., Wald R. K., Ruf T., Yu Y. P., Morkoc H.
Kluwer Academic Publishers
|
Klimin, S.N., Fomin, V.M., Devreese, J.T., Leburton, J.-P.
Electrochemical Society
|
Bergman, L., Bremser, M. D., Christman, J. A., King, S. W., Davis, R. F., Nemanich, R. J.
MRS - Materials Research Society
|
Vaart der van C. N., Steveninck van Ruyter de P. M., Kouwenhoven P. L., Johnson T. A., Enden der van A., Nazarov V. Y., …
Kluwer Academic Publishers
|
Wang,C.M., Chang,H.Y., Sun,K.W., Wang,S.Y., Lee,C.-P.
SPIE - The International Society for Optical Engineering
|
Forbang, T. F., McIntyre, C. R.
MRS - Materials Research Society
|
Shields J. A., Haisler A. V., Trallero-Giner C., Cardona M.
Kluwer Academic Publishers
|
Batistuta, M. V., Stella, M. F., Biagi, H., da Costa, J. C.
Electrochemical Society
|
Ruf T., Sapega F. V., Spitzer J., Belitsky J. V., Cardona M., Ploog K.
Kluwer Academic Publishers
|
Batistuta, M. V., Stella, M. F., Biagi, H., da Costa, J. C.
Electrochemical Society
|
Pophristic,M., Long,F.H., Tran,C.A., Ferguson,I.T., Karlicek,R.F.,Jr.
SPIE - The International Society for Optical Engineering
|
K. T. Tsen, J. G. Kiang, D. K. Ferry, H. Morkoc
SPIE - The International Society of Optical Engineering
|