Rossmann G. M., Arnold E., Erickson W. J., Frankenberger A. E., Griffith P. J., Hecht J. H., Johnson E. J., kamer G., …
Plenum Press
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Maleki, H., Ila, D., Holland, L. R., Zimmerman, R. L., Jenkins, G. M.
MRS - Materials Research Society
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Spitzer,M.B., Aquilino,P.D., Olson,M.H., McClelland,R.W., Rensing,N.M.
SPIE-The International Society for Optical Engineering
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Santhanam, Lakshmi, Hogg, Michael G., Holland, James A., Dordick, Jonathan S.
American Institute of Chemical Engineers
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Murthy N. R. M., Reid ?J. T., Sicignano A., Tanaka N., Rossmann G. Michael
D. Reidel
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H. N. Cheng, Tetsuo Asakura, Alan D. English
American Chemical Society
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Hahn G. Michael
Springer-Verlag
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Ryder, Graham, Norman, Marc D., Taylor, G. Jeffrey
National Aeronautics and Space Adminstration
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Holland S. K., Lewin G. C., Zehr R. T., Baker J. D., Laufer G., Krauss R. H.
SPIE - The International Society of Optical Engineering
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Albersheim P., Darvill G. A., Davis R. K., Doares H. S., Gollin J. D., O'Neill R., Toubart R. P., York S. W.
Springer-Verlag
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McClelland, R.J., Homma, Y.
Materials Research Society
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