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Characterization of diffusion length of minority carriers in(CdZn)Te at temperatures of 80 to 300 K

Author(s):
Franc,J. ( Charles Univ.(Czech Republic) )
Belas,E.
Hlidek,P.
Toth,A.L.
Sitter,H.
Grill,R.
Hoschl,P.
Moravec,P.
3 more
Publication title:
Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3890
Pub. date:
1999
Page(from):
163
Page(to):
169
Pub. info.:
Bellingham, Washington: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434913 [0819434914]
Language:
English
Call no.:
P63600/3890
Type:
Conference Proceedings

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