Blank Cover Image

Solar-radiation-based calibration in the range 740 to 2400 nm

Author(s):
Publication title:
Sensors, systems, and next-generation satellites III : 20-23 September 1999, Florence, Italy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3870
Pub. Year:
1999
Page(from):
228
Page(to):
233
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434654 [0819434655]
Language:
English
Call no.:
P63600/3870
Type:
Conference Proceedings

Similar Items:

P.N. Slater, S.F. Biggar, K.J. Thome, D.I. Gellman, P.R. Spyak

Society of Photo-optical Instrumentation Engineers

Nandy,P., Thome,K.J., Biggar,S.F.

SPIE-The International Society for Optical Engineering

Kuester,M.A., Thome,K.J., Biggar,S.F., Krause,K.S.

SPIE-The International Society for Optical Engineering

P.N. Slater, S.F. Biggar, J.M. Palmer, K.J. Thome

Society of Photo-optical Instrumentation Engineers

Parada,R.J., Thome,K.J., Biggar,S. F., Santer,R. P., LaMarr,J. H.

SPIE-The International Society for Optical Engineering

Nandy,P., Thome,K.J., Biggar,S.F.

SPIE - The International Society for Optical Engineering

Garland, W.C., Biggar, S.F., Zalewski, E.F., Thome, K.J.

SPIE - The International Society of Optical Engineering

Thome,K.J., Biggar,S.F., Slater,P.N.

SPIE-The International Society for Optical Engineering

Butler,J.J., Johnson,B.C., Brown,S.W., Yoon,H.W., Barnes,R.A., Markham,B.L., Biggar,S.F., Zalewski,E.F., Spyak,P.R., …

SPIE - The International Society for Optical Engineering

Thome, K.J., Czapla-Myers, J.S., Biggar, S.F.

SPIE-The International Society for Optical Engineering

Krause,K.S., Biggar,S.F., Thome,K.J., Eagen,J., Kenyon,D.

SPIE-The International Society for Optical Engineering

Thome,K.J., LaMarr,J.H., Biggar,S.F., Lopez,A.S.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12