Nonlinear features for product inspection

Nonlinear features for product inspection

Author(s):

Talukder,A. ( Carnegie Mellon Univ. )
Casasent,D.P.

Publication title:

Optical Pattern Recognition X

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3715

Pub. Year:

1999

Page(from):

32

Page(to):

41

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431899 [0819431893]

Language:

English

Call no.:

P63600/3715

Type:

Conference Proceedings

Details

TDL ID:	ZA00020870
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Optical Pattern Recognition
Conf. info. (Number):	1999 : 10th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1999.04.07-1999.04.08

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