Interferometric metrology of conformal domes

Interferometric metrology of conformal domes

Author(s):

Lerner,S.A. ( Optical Sciences Ctr./Univ.of Arizona )
Sasian,J.M.
Creivenkamp,J.E.
Gappinger,R.O.
Clark,S.R.

Publication title:

Window and dome technologies and materials VI : 5-6 April 1999, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3705

Pub. Year:

1999

Page(from):

221

Page(to):

226

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431790 [0819431796]

Language:

English

Call no.:

P63600/3705

Type:

Conference Proceedings

Details

TDL ID:	ZA00020869
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Window and dome technologies and materials
Conf. info. (Number):	1999 : 6th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1999.04.05-1999.04.06

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