High-Resolution Electron Microscopy of Dislocation Cores in NiAl
- Author(s):
- Publication title:
- High-Temperature ordered intermetallic alloys VIII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 552
- Pub. Year:
- 1999
- Page(from):
- KK9.8.1
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994584 [1558994580]
- Language:
- English
- Call no.:
- M23500/552
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
EXAMINATION OF DISLOCATION CORES IN Ni3Al USING HIGH RESOLUTION ELECTRON MICROSCOPY
Materials Research Society |
7
Conference Proceedings
Characterization of dislocations and interfaces in semiconductors by high resolution electron microscopy
North Holland |
Materials Research Society |
8
Conference Proceedings
CHARACTERIZATION OF TILT BOUNDARIES BY ULTRA HIGH RESOLUTION ELECTRON MICROSCOPY
Materials Research Society |
3
Conference Proceedings
High Resolution Electron Microscopy of Misfit Dislocations at Metal-Oxide Interfaces
Trans Tech Publications |
Materials Research Society |
4
Conference Proceedings
The use of high resolution electron microscopy in fundamental zeolite research
Elsevier |
Plenum Press |
5
Conference Proceedings
DEFECTS AND METAL PARTICLES IN ZEOLITES STUDIED WITH HIGH RESOLUTION ELECTRON MICROSCOPY
Materials Research Society |
North-Holland |
Trans Tech Publications |
Materials Research Society |