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Dependence of the Residual Strain in GaN on the AlN Buffer Layer Annealing Parameters

Author(s):
Vaillant, Y-M. Le
Clur, S.
Andenet, A.
Briot, O.
Gil, B.
Aulombard, R. L.
Bisaro, R.
Olivier, J.
Durand, O.
Duboz, J-Y.
5 more
Publication title:
Gallium nitride and related materials II : symposium held April 1-4, 1997, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
468
Pub. Year:
1997
Page(from):
173
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993723 [155899372X]
Language:
English
Call no.:
M23500/468
Type:
Conference Proceedings

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