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CHARACTERIZATION OF THE SUBSTRATE INTERFACE OF EXCIMER LASER CRYSTALLIZED POLYCRYSTALLINE SILICON THIN FILMS

Author(s):
Anderson, G. B.
Boyce, J. B.
Fork, D. K.
Johnson, R. I.
Mei, P.
Ready, S. E.
1 more
Publication title:
Polycrystalline thin films : structure, texture, properties, and applications : symposium held April 4-8, 1994, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
343
Pub. Year:
1994
Page(from):
709
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992436 [155899243X]
Language:
English
Call no.:
M23500/343
Type:
Conference Proceedings

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