Improving neural network models of defect content in complex software systems

Improving neural network models of defect content in complex software systems

Author(s):

Publication title:

Applications and science of artificial neural networks II : 9-12 April, 1996, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2760

Pub. Year:

1996

Page(from):

713

Page(to):

724

Pub. info.:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421418 [0819421413]

Language:

English

Call no.:

P63600/2760

Type:

Conference Proceedings

Details

TDL ID:	ZA00020767
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Applications and Science of Artificial Neural Networks
Conf. info. (Number):	1996 : 2nd
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1996.04.09-1996.04.12

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