Water-quality inspection by analyzing motionality of fish
- Author(s):
- Park,S.-J. ( Soongsil Univ. )
- Kim,K.-S.
- Choi,H.-I.
- Lee,H.-K.
- Lee,Y.-H.
- Publication title:
- Automated optical inspection for industry : 6-7 November 1996, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2899
- Pub. Year:
- 1996
- Page(from):
- 646
- Page(to):
- 653
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819423009 [0819423009]
- Language:
- English
- Call no.:
- P63600/2899
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
A scalable SIMD digital signal processor for high-quality multifunctional printer systems
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Optimization of ABS considering the static and dynamic characteristics for OFH [5966-72]
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Comparative evaluation of mask production CAR development processes with stepwise defect inspection
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Hierarchical heterogeneous multiprocessor system for real-time motion picture coding
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Performace analysis of wavelet based restoration for passive millimeter-wave images
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
10
Conference Proceedings
Quality Improvement of 4″ 4H-SiC Crystal by Using Modified Seed Adhesion Method
Trans Tech Publications |
5
Conference Proceedings
EUV mask pattern inspection for memory mask fabrication in 45-nm node and below [6349-95]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Simulation and experiments for inspection properties of EUV mask defects [6283-85]
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
A study for effect of rounded contact hole pattern by laser mask writng machine onto wafer process margin [6283-15]
SPIE - The International Society of Optical Engineering |